Tile Registration

Due to minute inaccuracies in camera positioning, image registration is required to determine the exact relative position of adjacent tiles. Microscopy Image Stitching Tool (MIST) library uses CUDA FFT phase correlation to find offsets with the highest correlation between overlapping areas. MIST was originally developed by Dr. Timothy Blattner, Ph.D. at National Institute of Standards and Technology (NIST) Information Technology Laboratory (ITL), and is essential in minimizing tile stitching errors.

Chalfoun, J., Majurski, M., Blattner, T., Bhadriraju, K., Keyrouz, W., Bajcsy, P., & Brady, M. (2017). MIST: accurate and scalable microscopy image stitching tool with stage modeling and error minimization. Scientific reports, 7(1), 4988.

GitHub Link